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Learning from production test data : from statistical characterization to modeling for anomaly detection
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AFD-based signal line electromigration reliability modeling and lifetime prediction
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Modeling electronic properties of complex oxides
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Hardware aware and architecture friendly training of memristive crossbar circuits as neural network pattern classifiers
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A modular approach to analyzing biological networks
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Transparent conducting oxide clad limited area epitaxy semipolar III-nitride laser diodes
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Area-efficient neuromorphic silicon xircuits and architectures using spatial and spatio-temporal approaches
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Wavelength tunable monolithic InP receivers and switches for optical communication systems
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A deterministic annealing framework for global optimization of delay-constrained communication and control strategies
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Segmentation of 3D visual data and its applications
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