Search Constraints
Search Results
Select an image to start the slideshow
Characterizing local structure in complex oxides with quantitative scanning transmission electron microscopy
1 of 4
Highly scaled high dielectric constant oxides on III-V CMOS with low interface trap and low leakage densities
2 of 4
Tunable dielectric response, resistive switching, and unconventional transport in SrTiO3
3 of 4
Processing and characterization of titanium dioxide based resistive switches
4 of 4