Towards Data Reliable, Low-Power, and Repairable Resistive Random Access Memories
- Author:
- Ghofrani, Amirali
- Degree Grantor:
- University of California, Santa Barbara. Electrical & Computer Engineering
- Place of Publication:
- [Santa Barbara, Calif.]
- Publisher:
- University of California, Santa Barbara
- Creation Date:
- 2016
- Issued Date:
- 2016
- Keywords:
- Memristor,
Reliability,
Low-Power,
ReRAM,
Memory Repair, and
Memory Testing
- Format:
- Text
- Collection(s):
- UCSB electronic theses and dissertations
- ARK:
- ark:/48907/f3pz58wh
- Catalog System Number:
- 990046968420203776
- Copyright:
- Amirali Ghofrani, 2016
- Rights:
In Copyright- Copyright Holder:
- Amirali Ghofrani