Alexandria Digital Research Library

Characterizing local structure in complex oxides with quantitative scanning transmission electron microscopy

Highly scaled high dielectric constant oxides on III-V CMOS with low interface trap and low leakage densities

Design and characterization of high-strength bond coats for improved thermal barrier coating durability

III-Nitride Vertical-Cavity Surface-Emitting Lasers

Ductile-Phase-Toughened Tungsten for Plasma-Facing Materials

Pushing the envelope of magnetic tweezer resolution