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  1. Highly scaled high dielectric constant oxides on III-V CMOS with low interface trap and low leakage densities

    Format:
    Text
    Collection:
    UCSB electronic theses and dissertations
    Author:
    Chobpattana, Varistha
    Creation Date:
    2016
    Issued Date:
    2016

  2. High dielectric constant oxides on III-V complementary metal-oxide-semiconductors

    Format:
    Text
    Collection:
    UCSB electronic theses and dissertations
    Author:
    Chobpattana, Varistha
    Creation Date:
    2012
    Issued Date:
    2012